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Course Information

Metrology & Instrumentation (IE 433)

Term: 2018-2019 Academic Year Fall Semester

Faculty

Vincent J. Vohnout
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Schedule

Tue-Thu, 3:30 PM - 4:50 PM (8/13/2018 - 12/6/2018) Location: MAIN TECH 322

Description

Students will learn different types of measurement techniques, including laser scanning for computer-aided manufacturing and inspection, optical instruments, temperature, pressure, and force measurements. Medium to long range scanners and close range high quality scanners will be used in the course. Students will gain hands-on experience in capturing digital data, registering scan, and processing scans. Prerequisite: IE-223. Offered: Fall.